Public Member Functions

FltTestPattern (const char *name, int slotID, int regID, int r, int w, int len)
int read (unsigned long *data)
void write (unsigned long *data)
void write (unsigned long *data, int n)
unsigned long readFirst ()
unsigned long readNext ()
void writeFirst (unsigned long data)
void writeNext (unsigned long data)
void rewind ()
void setMode (int mode)

Detailed Description

The test pattern memory uses a special address technique.

With every access the address pointer is incremented. The prefered access will be the block transfer. In single access mode it is necessary to prevent two processes to access the test pattern memory at the same time. (Solution: High level semaphore for the test pattern memory!.)

+ The end of the actual test pattern is marked to allow a cyclic interpretation of the test pattern.

Changes:

The adress scheme of the test pattern memory has changed. Now bit 24 is used to control the position of read and write pointer, ak 12.12.00

Todo:: Add description for the test pattern modes. Is it possible read the actual mode?

Definition at line 50 of file FltTestPattern.h.

Constructor & Destructor Documentation

FltTestPattern::FltTestPattern	(	const char *	name,
		int	slotID,
		int	regID,
		int	r,
		int	w,
		int	len
	)

Member Function Documentation

int FltTestPattern::read ( unsigned long * data )

Read the test pattern memory.

The command allays reads the complete test pattern memory and returns the length of the test pattern given by the (first) end mark.

unsigned long FltTestPattern::readFirst ( )

Performs a reset both access pointers and reads the first pattern.

unsigned long FltTestPattern::readNext ( )

Read a single pattern and increment the read-access pointer.

void FltTestPattern::rewind ( )

Set the read and write access pointer to the begin of the test pattern memory.

void FltTestPattern::setMode ( int mode )

Set the mode of the test pattern generation.

void FltTestPattern::write ( unsigned long * data )

Write the test pattern memory.

The complete memory is used to store the test pattern.

Reimplemented from FltPixRegister.

void FltTestPattern::write	(	unsigned long *	data,
		int	n
	)

Write a test pattern of n words length.

The last word is marked as the end of the test pattern memory.

void FltTestPattern::writeFirst ( unsigned long data )

Performs a reset of both access pointers and writes the first pattern.

void FltTestPattern::writeNext ( unsigned long data )

Write a single pattern and increment the write-access pointer.

The documentation for this class was generated from the following file:

/home/kopmann/git-mirror/fdhwlib/fdhwlib/Hw/FltTestPattern.h